Table of Contents
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Priyanka Verma, Anjali Goyal, Yogita Gigras
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1-12
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Veera Boopathy E
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13-16
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Tanweer Alam, Abdulrahman A. Salem, Ahmad O. Alsharif, Abdulaziz M. Alhejaili
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17-25
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Extraction of series resistance and mobility degradation parameter in MOSFETs using iterative method
Noureddine Maouhoub, Khalid Rais
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26-31
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Harya Gusdevi, Ade Setya P, Puji Handini Zulaeha
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32-38
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Computer Science and Information Technologies
ISSN: 2722-323X, e-ISSN: 2722-3221
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).
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