Rais, Khalid, Chouaib Doukkali University, Morocco

• Vol 1, No 1: May 2020 - Articles
  Extraction of series resistance and mobility degradation parameter in MOSFETs using iterative method
  Abstract  PDF

Computer Science and Information Technologies
ISSN: 2722-323X, e-ISSN: 2722-3221
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).

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